Fault Ride-Through (FRT) testing of an energy storage Power Conversion System (PCS) is a strict compliance test. It is mainly used to verify whether the PCS can remain continuously connected to the grid without tripping when voltage sags or swells occur, and whether it can provide the necessary reactive power support to the grid as required.

Programmable Grid Simulators: A Key Tool for Modern Power Electronics Testing With the rapid growth of renewable energy and the increasing complexity of power electronic systems, comprehensive, efficient, and safe testing of photovoltaic inverters, energy storage converters, and EV charging equipment has become a critical challenge.

Intelligent manufacturing has accelerated in recent years, penetrating into the automotive, new energy, consumer electronics, industrial manufacturing and other industries, leading industrial transformation and upgrading. Through data analysis and artificial intelligence technology, intelligent manufacturing can automatically make decisions, optimize the production process, highly automated to complete the production task, reduce human intervention, significantly improve production accuracy, production quality, production efficiency.

Background: The Rapid Evolution of EV Charging Technology As electric vehicle (EV) adoption accelerates, the demand for faster and more efficient charging solutions is growing exponentially. The industry is witnessing a clear power trend in charging technologies:

Optical modules are a core component of modern communication technology, widely used in data centers, 5G networks, and optical fiber communications. Optical modules typically consist of optical transmitting components, optical receiving components, laser diode chips (LD), photodetector chips (PD), and other parts. To ensure these devices operate normally under the requirements of high performance, high speed, and high stability, the accuracy and reliability of testing equipment are crucial. ITECH's IT2800 series Graphical Source Measure Unit, with their high precision, high resolution, and high-speed pulse scanning advantages, provide an excellent solution for testing optical modules and their core optoelectronic chips.

With the rapid development of core industries such as AI data centers, photovoltaic energy storage, and rail transportation, the voltage withstand and efficiency requirements of SiC (Silicon Carbide) devices continue to rise. The voltage rating of SiC devices has gradually increased from the traditional 650 V to 1200 V, and is even moving toward the high-end 1700 V range. Correspondingly, the reliability test voltages for SiC devices are also being raised, creating an urgent market demand for high-voltage precision DC power supplies—a critical technological breakthrough driving the advancement of the SiC industry.