In-Depth Analysis of HTRB Testing for SiC Devices: How the IT-N6700 Wide-Range Programmable DC Power Supply Addresses Challenges in High-Voltage Testing
With the rapid development of core industries such as AI data centers, photovoltaic energy storage, and rail transportation, the voltage withstand and efficiency requirements of SiC (Silicon Carbide) devices continue to rise. The voltage rating of SiC devices has gradually increased from the traditional 650 V to 1200 V, and is even moving toward the high-end 1700 V range. Correspondingly, the reliability test voltages for SiC devices are also being raised, creating an urgent market demand for high-voltage precision DC power supplies—a critical technological breakthrough driving the advancement of the SiC industry.
HTRB Testing – A Mandatory Reliability Check for SiC Devices
HTRB (High Temperature Reverse Bias) is a critical part of reliability verification for SiC devices. By applying a reverse bias voltage under high-temperature conditions and performing long-term stress testing, it effectively screens for PN junction defects and verifies the stability of leakage current in SiC devices. The test duration typically exceeds 1,000 hours.
The essential requirement of this test is:
- A high-voltage, long-term stable reverse bias voltage.
According to industry standards (such as AEC-Q101 and AQG 324), HTRB testing typically requires applying a reverse bias voltage of:
- Approximately 80% of the device’s rated reverse breakdown voltage (BVdss or Vds,max), or
- The maximum specified reverse DC voltage of the device.
Taking a mainstream 1700 V SiC MOSFET as an example, the actual test bias reaches the kilovolt high-voltage range. Following the 80% stress rule, the reverse bias voltage can reach approximately 1360 V.
IT-N6700 Series Wide-Range Programmable DC Power Supply: The Ideal Platform for High-Voltage Stable Biasing
To address the challenges of high-temperature reverse bias (HTRB) testing for SiC devices, ITECH has launched the IT-N6700 series 1500 V high-voltage programmable DC power supplies. This series is specifically designed for high-voltage testing applications, providing high-precision, highly stable power output to support long-term stable biasing of SiC devices under high-temperature conditions.
The IT-N6700 series includes two main models:
- IT-N6723P (1500 V / 2 A / 1000 W)
- IT-N6724P (1500 V / 2 A / 1500 W)
Key Features:
- High-Voltage Precision Output: Covers the HTRB test voltage range for 1200 V and above SiC devices, meeting the approximate 80% rated reverse bias requirement.
- Programmable Interfaces: Standard USB and Ethernet interfaces enable easy integration with HTRB automated test benches, supporting system-level integration.
- Comprehensive Safety Protections: OCP/OVP/UVP/OPP/OTP/Foldback
- Adjustable Voltage Ramp Up/Down: Flexibly adjust the voltage change rate to meet different test requirements.
- CC/CV Priority Control: Effectively suppresses overshoot, preventing damage to SiC devices.
For more product details, please visit: https://www.itechate.com/en/product/dc-power-supply/IT-N6700.html
